Woojin Soh
Ph.D., 2015
Development and Comparison of Parameter Design Methods for Multiple Performance Characteristics
NVIDIA
Ph.D., 2015
Development and Comparison of Parameter Design Methods for Multiple Performance Characteristics
NVIDIA
Ph.D., 2020
Bayesian Nonparametric Models for Spatial Data Analysis
Amazon Web Services (AWS)
Ph.D., 2021
Machine Learning Methods for Black-Box Optimization and Image Classification
Samsung Electronics
Ph.D., 2022
Machine Learning Methods for Contextual Anomaly Detection
Assistant professor, Department of Industrial and Management Engineering, Myongji University
Ph.D., 2022
Deep Learning Methods for Anomaly Detection and Robust Density Estimation
Samsung Advanced Institute of Technology
Ph.D., 2022
Few-Shot Out-of-Distribution Detection and Classification for Mixed-Type Defect Patterns
Defense Agency of Technology and Quality (DTaQ)
Ph.D., 2022
Simultaneous Clustering and Feature Selection for High-dimensional Data
Samsung Electronics
Ph.D., 2024
Class-Imbalanced Semi-Supervised Learning
KRAFTON AI
Ph.D., 2025
Deep Learning Models for Robust Training of Incomplete and Imbalanced Data
Samsung Electronics
Ph.D., 2025
Deep Learning Methods for Discovering Causal Factors and Their Applications
Samsung AI Center
Ph.D., 2026
Deep Learning Models for Multivariate Time Series Forecasting and Anomaly Detection
Assistant Professor, Industrial Engineering, Pusan National University
M.S., 2016
Hierarchical Spatially Varying Coefficient Process Models with Application to Housing Market Analysis
SK Telecom
M.S., 2016
Detection of Premature Ventricular Contraction Using Wavelet-Based Statistical ECG Monitoring
Assistant professor, School of Information Sciences, University of Illinois at Urbana-Champaign
M.S., 2016
Functional Logistic Regression with Fused Lasso Penalty
Ph.D. student in iStat Lab
M.S., 2016
Detection and Clustering of Mixed-Type Defect Patterns in Wafer Bin Maps
SK Hynix
M.S., 2016
TrailSense : A Crowdsensing System for Detecting Risky Mountain Trail Segments with Walking Pattern Analysis
Ph.D. student in iStat Lab
M.S., 2017
Crime Risk Maps : Multivariate Analysis of Spatial Crime Data
Assistant professor, Department of Industrial Engineering, Hanyang University
M.S., 2017
Spatio-Temporal Autoregressive Models of Monthly Air Passenger Flows
Qualcomm
M.S., 2018
Classification of Mixed-Type Defects Patterns in Wafer Bin Maps Using Convolutional Neural Networks
NCSoft
M.S., 2018
Modeling the Probability of A Batter/Pitcher Matchup Dvent : A Bayesian Approach
Ph.D. student in iStat Lab
M.S., 2019
Fault Diagnosis for High-Dimensional Complex Process Using Semi-Dupervised Deep Convolutional Generative Models
NICE
M.S., 2019
Improving Baseball Pitch Type Classification Through Clustering of Pitchers
TmaxSoft
M.S., 2019
Phenotyping Obstructive Sleep Apnea Patients and Prognosis of Their Comorbidities Through Machine Learning Methods
Ph.D. student in iStat Lab
M.S., 2019
Bayesian Nonparametric Latent Class Model for Longitudinal Data
Ph.D. student in iStat Lab
M.S., 2020
Deep Gaussian Process Models for Integrating Multifidelity Experiments Having Non-stationary Relationship
Graduate School of AI, KAIST
M.S., 2020
Semi-Supervised Multi-Label Learning for Classification of Wafer Bin Maps with Mixed-type Defect Patterns
Ph.D. student in iStat Lab
M.S., 2020
Memory-Augmented Convolutional Neural Networks with Triplet Loss for Imbalanced Wafer Defect Pattern Classification
M.S., 2020
Variational Deep Clustering of Wafer Map Patterns
Samsung Electronics
M.S., 2021
A Bayesian Deep Learning Method for Predicting Highly Imbalanced Package Test Results
SK Hynix
M.S., 2021
Noisy Label Correction for Classification of Wafer Bin Maps with Mixed-Type Defect Patterns
Hyundai Card
M.S., 2021
Location Dependent Dirichlet Process Mixture Model for Clustering Spatially Correlated Time Series
Ph.D. student in iStat Lab
M.S., 2022
Semi-Supervised Learning for Simultaneous Location Detection and Classification of Mixed-Type Defect Patterns in Wafer Bin Maps
Samsung Electronics
M.S., 2022
Open Set Recognition of Wafer Bin Map Defect Patterns
ClassOn
M.S., 2022
Weakly Supervised Semantic Segmentation for Classifying Wafer Chip-Level Defect Types
Upstage
M.S., 2023
Prediction of Highly Imbalanced Semiconductor Chip-Level Defects in Module Tests Using Multimodal Fusion and Logit Adjustment
SK Hynix
M.S., 2023
Few-Shot Classification of Wafer Bin Maps Using Transfer Learning and Ensemble Learning
Samsung Electronics
M.S., 2023
Classification and Out-of-Distribution Detection for Wafer Bin Maps
Samsung Electronics
M.S., 2024
CDRA: Class Distribution-Based Re-Balancing Algorithm for Class-Imbalanced Semi-Supervised Learning
Ph.D. student in iStat Lab
M.S., 2024
Knowledge-Assisted Multi-Graph Structure Learning for Multivariate Time-Series Anomaly Detection in Multi-Stage Industrial Processes
Ph.D. student in iStat Lab
M.S., 2026
Robust Vessel Trajectory Prediction Under Long Missing Gaps
Alsemy
M.S., 2026
Toward Uniformly Flat Minima for Domain Generalization
Ph.D. student in iStat Lab